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AS ISO 19319-2006
$119.20
Surface chemical analysis — Augur electron spectroscopy and X-ray photoelectron spectroscopy — Determination of lateral resolution, analysis area and sample area viewed by the analyser
Adopts ISO 19319:2003 to provide information for measuring lateral analysis, the analysis area and the sample area viewed by the analyser in Auger electron spectroscopy and X-ray photoelectron spectroscopy.
