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AS ISO 18118-2006
$119.20
Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
Adopts ISO 18118:2004 to give guidance on the measurement and use of experimentally determined relative sensitivity factors for quantitative analysis of homogeneous materials by Auger electron spectroscopy and X-ray photoelectron spectroscopy.
