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AS ISO 18118: 10/20/2006 Surface chemical analysis – Auger electron spectroscopy and X-ray photoelectron spectroscopy – Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials

AS ISO 18118: 10/20/2006 Surface chemical analysis – Auger electron spectroscopy and X-ray photoelectron spectroscopy – Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials

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Surface chemical analysis – Auger electron spectroscopy and X-ray photoelectron spectroscopy – Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials 10/20/2006

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ISBN(s): 0733777945

Adopts ISO 18118:2004 to give guidance on the measurement and use of experimentally determined relative sensitivity factors for quantitative analysis of homogeneous materials by Auger electron spectroscopy and X-ray photoelectron spectroscopy.

Attributes

Edition 1st
Published 10/20/2006
ISBN(s) 0733777945
Number of Pages 23
File Size 1 file, 700 KB
Product Code(s) 10109703, 10109709, 10109672
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