Adopts ISO 14975:2000 to specify a format to supplement AS ISO 14976 to transfer data for the creation, expansion and revision of a surface chemical analysis spectral data base.
Table of contents
Header
About this publication
Preface
Introduction
1 Scope
2 Normative reference
3 Terms and definitions
4 Symbols and abbreviated terms
5 Description of information formats
5.1 General
5.2 Additional rules and definitions
5.3 The formats
5.3.1 Structures
5.3.1.1 Contents of the specimen information package
5.3.1.2 Contents of calibration information package
5.3.1.3 Contents of data processing information package
5.3.2 Definition of the items in the formats
5.3.2.1 Specimen information format
5.3.2.2 Calibration information format
5.3.2.3 Data processing information format
Annex A
A.1 Host material
A.2 Host material composition
A.3 Bulk purity
A.4 Known impurities
A.5 Forms of product
A.6 Energy scale calibration
A.7 Intensity scale calibration
A.8 Resolution calibration
A.9 Data processing calibration
Annex B
B.1 Example 1:Formats for describing a processed and calibrated X-ray photoelectron spectrum from a supermarket bag
B.2 Example 2: Formats for describing a processed and calibrated X-ray photoelectron spectrum from a multi-layered semiconductor film
B.3 Example 3: Formats for describing a processed and calibrated Auger electron spectrum from powder of an inorganic material
B.4 Example 4: Formats for describing a processed and calibrated Auger electron spectrum from a kitchen sink
B.5 Example 5: Formats for describing a processed and calibrated X-ray photoelectron spectrum from a lubricant film on a magnetic disk
