AS ISO 14606: 10/20/2006 Surface chemical analysis – Sputter depth profiling – Optimization using layered systems as reference materials
Original price was: $54.77.$26.40Current price is: $26.40.
Surface chemical analysis – Sputter depth profiling – Optimization using layered systems as reference materials 10/20/2006
ISBN(s): 0733777953
Adopts ISO 14606:2000 to give guidance on the optimization of sputter depth profiling parameters using appropriate single-layered and multi-layered reference materials in order to achieve optimum depth resolution as a function of instrument settings.
Attributes
| Edition | 1st |
|---|---|
| Published | 10/20/2006 |
| ISBN(s) | 0733777953 |
| Number of Pages | 15 |
| File Size | 1 file, 690 KB |
| Product Code(s) | 10148313, 10148302, 10148310 |
| Note | This product is unavailable in Ukraine, Russia, Belarus |
Related products
-
AS 60068.2.78: 02/27/2026 Environmental testing, Part 2.78: Tests – Test Cab: Damp heat, steady state (IEC-60068-2-78:2025 (ED. 3.0) MOD)
-
AS 7240.2: 04/02/2026 Fire detection and alarm systems, Part 2: Fire detection control and indicating equipment (ISO 7240-2:2017, MOD)
-
AS IEC 61479: 02/20/2026 Live working – Flexible conductor covers (line hoses) of insulating material
-
AS ISO/ASTM 52931: 02/13/2026 Additive manufacturing of metals – Environment, health and safety – General principles for use of metallic materials