AS IEC 61164: 01/01/2008 Reliability growth – Statistical test and estimation methods
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Reliability growth – Statistical test and estimation methods 01/01/2008
ISBN(s): 0733788408
Adopts IEC 61164 Ed. 2.0 (2004) to describe the power law reliability growth model and related projection model, with step-by-step guidance on their use.
Attributes
| Edition | 1st |
|---|---|
| Published | 01/01/2008 |
| ISBN(s) | 0733788408 |
| Number of Pages | 49 |
| File Size | 1 file, 1.8 MB |
| Product Code(s) | 10085740, 10085719, 10085756 |
| Note | This product is unavailable in Ukraine, Russia, Belarus |
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