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AS C366.4: 12/31/1977 Essential ratings and characteristics of semiconductor devices and general principles of measuring methods – Acceptance and reliability

AS C366.4: 12/31/1977 Essential ratings and characteristics of semiconductor devices and general principles of measuring methods – Acceptance and reliability

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Essential ratings and characteristics of semiconductor devices and general principles of measuring methods – Acceptance and reliability 12/31/1977

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ISBN(s): 0726215414

This part of AS C366 specifies conditions for electrical tests, for different temperature conditions and for different durations. Failure-defining characteristics and failure criteria are specified for each device category. This permits the comparison of data relative to acceptance testing and reliability testing of semiconductor devices and integrated circuits.

Attributes

Edition 1st
Published 12/31/1977
ISBN(s) 0726215414
Number of Pages 13
File Size 1 file, 950 KB
Product Code(s) 10171528
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