AS 2168.1-2009

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Non-destructive testing — Computerized radiography, Part 1: Systems

Specifies the performance of computed radiography systems and the measurement of the parameters for the system scanner and storage phosphor imaging plate.

Table of contents
Header
About this publication
Preface
1 Scope
2 Referenced documents
3 Definitions
4 Personnel qualification and vision requirements
4.1 Personnel qualifications
4.2 Vision requirements
5 CR quality indicators
5.1 General
5.1.1 Contrast sensitivity quality indicator
5.1.2 Duplex wire quality indicator
5.1.3 Converging line pair quality indicator
5.1.4 Linearity quality indicators
5.1.5 T-target
5.1.6 Scanner slipping quality indicator
5.1.7 Shading quality indicator
5.1.8 Central beam alignment quality indicator (BAM-snail)
5.2 Application procedures for CR quality indicators
5.2.1 General
5.2.2 Exposure of CR quality indicators (user test)
5.2.3 Initial assessment of CR quality indicators (user test)
5.2.4 Periodical control (user test)
5.3 Imaging plate fading
6 Procedure for quantitative measurement of image quality parameters
6.1 Measurement of the normalized Signal-to-Noise Ratio (SNR)
6.1.1 Step Exposure Method (manufacturer test)
6.1.2 Step Wedge Method (manufacturer test and enhanced user test)
6.1.3 Contrast sensitivity measurement (manufacturer and user test)
6.2 Measurement of minimum read-out intensity of computed radiographs (manufacturer procedure)
6.3 Determination of un-sharpness
6.3.1 General
6.3.2 MTF-method (manufacturer test)
6.3.3 Duplex wire method (manufacturer and user test)
6.3.4 Converging line pair quality indicators (manufacturer and user test)
6.4 Other tests
6.4.1 Geometric distortions (manufacturer and user test)
6.4.2 Laser beam function (manufacturer and user test)
6.4.3 Blooming or flare (manufacturer and user test)
6.4.4 Scanner slipping (manufacturer and user test)
6.4.5 Shading (manufacturer and user test)
6.4.6 Erasure (manufacturer and user test)
6.4.7 IP artefacts (user test)
7 CR system classification and interpretation of results
7.1 General
7.2 Range of CR system classification
7.3 Determination of CEN speed (manufacturer procedure)
Appendix A
Appendix B
B1 Location and alignment of CR quality indicators in a CR phantom
B2 Shading test
B2.1 General
B2.2 Shading Quality Indicator
B2.3 Procedure
B3 Central beam alignment
B3.1 CR Alignment Quality Indicator (BAM-snail)
B3.2 Procedure
B4 Contrast sensitivity quality indicator
Appendix C
C1 Manufacturer tests
C2 Tests after repair, upgrade or the use of an improved IP
C3 User tests for long-term stability

Cited references in this standard
Content history
DR 06542

AS 2168.1-2009 REC:2019

Please select a variation to view its description.

Published

30/06/2009

Pages

25

Please select a variation to view its pdf.

AS 2168.1-2009
$125.14