AS 1099.2.10-1989

$89.78

Basic environmental testing procedures for electrotechnology, Part 2.10: Tests — Test J — Mould growth

Sets out a method for assessing causes of deterioration in assembled equipments due to mould growth, whether or not constructed from mould-resistant materials, by the application of a selected test using the required severity and assessing the mould growth after the required period of incubation with respect to any physical damage or functional deterioration. It is identical with and reproduced from IEC 68-2-10:1988.

Content history

[Superseded]

IEC 68-2-10-1988

Please select a variation to view its description.

Published

01/01/1989

Pages

22

Please select a variation to view its pdf.

AS 1099.2.10-1989
$89.78